BENCHTOP SPECTROPHOTOMETERS
Datacolor ELREPHO : Quality Control for the Paper Industry
Datacolor Elrepho is a high-performance spectrophotometer designed for colour and quality control in the paper industry.
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Designed for the paper industry, the Elrepho is a high performance spectrophotometer.
For use in laboratory or production control of colour, brightness, opacity, diffuse reflectance factors, yellowness, and whiteness of pulp, paper and chemicals.
Benefits of Elrepho:
- The dual beam spectrophotometer with diffuse/0º optical geometry and an automated, adjustable UV filter conforms to ISO 2469. When combined with Datacolor Tools quality control software, it supports measurement procedures for the paper industry as defined by ISO, DIN, SCAN and TAPPI Standards.
- Vertical configuration and through-the-sphere sample viewer enables easy operation, faster measurements and higher throughput.
- Three included aperture plates allow for flexible applications. SAV and USAV plates enable accurate measurement of small and very small areas of a sample, while the XLAV plate is recommended for irregular and textured sample averaging.
- The built-in, durable, pulsed xenon light source approximates D65, an automated zoom lens, and adjustable, automated UV cut-off filters for three wavelengths to control the UV component from the light source.
What You Get
Tech Specs
Requirements
Resources
What You Get
Model come with the following standard accessories:
| Six foot power cable |
| Serial cable with connectors on either end |
| USB cable |
| Black trap |
| White tile |
| Green tile |
| Extra-Large Area View (XLAV) aperture plate |
| Small Area View (SAV) aperture plate |
| Ultra-Small Area View (USAV) aperture plate |
Tech Specs
| Datacolor ELREPHO | |
|---|---|
| Instrument Type | Vertical mount desktop instrument |
| Measurement Geometry | Diffuse illumination 0º viewing |
| Light Source | Pulsed xenon lamp |
| Sphere Diameter | 152 mm/6.0 in |
| Wavelength Range | 360 nm to 700 nm |
| Reporting Interval | 10 nm |
| Effective Bandwidth | 10 nm |
| Photometric Range | 0 to 200% |
| Spectral Analyser | SP2000 analyser with dual 256 diode array and high-resolution holographic grating |
| Wavelength Alignment Method | Via software alignment |
| 20 read repeatability on white tile using dual flash (CIELAB) (1) | 0.02 (max) |
| Inter-instrument agreement: reflectance measurements (CIELAB) (1, 2 &3) | 0.4 (max), 0.2 (average) |
| Lens | 3-position, auto zoom |
| Aperture Plates | XLAV Aperture 34 mm illuminated and 30 mm measured SAV Aperture 9mm illuminated and 5 mm measured USAV Aperture 6.5 mm illuminated and 2.5 mm measured |
| Aperture Detection | No |
| Automated UV Control | (Automatic UV calibration for the measurement of fluorescent specimens with UV cutoff filters at 395 nm, 420 nm and 460 nm) |
| UV Cutoff Filters | 395 nm, 420 nm, 460 nm |
| Functional Operating Environment (2) | 5º to 40º C, 5% to 85% non-condensing relative humidity |
| Vertical Mount | Includes peephole sample viewer and pedestal sample holder |
| PHYSICAL SPECIFICATIONS | |
| Weight | 19.05 kg / 42 lb |
| Dimensions | 25.0″/635mm (Height) x 12.3″/312mm (Width) x 14.25″/362mm (Depth) |
| Power Requirements | 85 to 264 VAC, 47 to 63 Hz, 80 VA peak, 35 VA typical |
| Power Consumption | 100VA |
| ADDITIONAL TECHNICAL SPECIFICATIONS | |
| Data Interface | RS-232 9600/19200 baud/USB 1.1 |
| Photometric Resolution | 0.00% |
| Black Trap | High performance |
(1) Environmental Conditions: Temperature 23°C +/- 1°C RH 50% +/- 10%
(2) For reliable colour measurements, conditions must be within recommended operating conditions.
(3) Colour equation is CIELab (D65/10), SAV, Specular Included, Measured on 12 BCRA Tiles
Requirements
| POWER REQUIREMENTS |
|---|
| 85 to 264 VAC |
| 47 to 63 Hz |
| 80 VA peak |
| 35 VA typical |
| ABSOLUTE OPERATING RANGE |
| 5º to 40º C |
| 5% to 85% non-condensing relative humidity |
Resources
Colour Management Solutions
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